LIU Ning, CHEN Qian, GU Guo-hua, SUI Xiu-bao. The Noise Analysis and Inhibition Technology of the Driving Circuits of the 640×512 IR Focal Plane Detector[J]. Infrared Technology , 2010, 32(10): 572-575,582. DOI: 10.3969/j.issn.1001-8891.2010.10.004
|
Citation:
|
LIU Ning, CHEN Qian, GU Guo-hua, SUI Xiu-bao. The Noise Analysis and Inhibition Technology of the Driving Circuits of the 640×512 IR Focal Plane Detector[J]. Infrared Technology , 2010, 32(10): 572-575,582. DOI: 10.3969/j.issn.1001-8891.2010.10.004
|
LIU Ning, CHEN Qian, GU Guo-hua, SUI Xiu-bao. The Noise Analysis and Inhibition Technology of the Driving Circuits of the 640×512 IR Focal Plane Detector[J]. Infrared Technology , 2010, 32(10): 572-575,582. DOI: 10.3969/j.issn.1001-8891.2010.10.004
|
Citation:
|
LIU Ning, CHEN Qian, GU Guo-hua, SUI Xiu-bao. The Noise Analysis and Inhibition Technology of the Driving Circuits of the 640×512 IR Focal Plane Detector[J]. Infrared Technology , 2010, 32(10): 572-575,582. DOI: 10.3969/j.issn.1001-8891.2010.10.004
|
DownLoad: