SU Yu-hui, GONG Xiao-xia, LEI Sheng-qiong, YANG Wen-yun. Discussion of Reliability Evaluation on Infrared Photovoltaic Detector by Noise[J]. Infrared Technology , 2009, 31(9): 509-512. DOI: 10.3969/j.issn.1001-8891.2009.09.003
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Citation:
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SU Yu-hui, GONG Xiao-xia, LEI Sheng-qiong, YANG Wen-yun. Discussion of Reliability Evaluation on Infrared Photovoltaic Detector by Noise[J]. Infrared Technology , 2009, 31(9): 509-512. DOI: 10.3969/j.issn.1001-8891.2009.09.003
|
SU Yu-hui, GONG Xiao-xia, LEI Sheng-qiong, YANG Wen-yun. Discussion of Reliability Evaluation on Infrared Photovoltaic Detector by Noise[J]. Infrared Technology , 2009, 31(9): 509-512. DOI: 10.3969/j.issn.1001-8891.2009.09.003
|
Citation:
|
SU Yu-hui, GONG Xiao-xia, LEI Sheng-qiong, YANG Wen-yun. Discussion of Reliability Evaluation on Infrared Photovoltaic Detector by Noise[J]. Infrared Technology , 2009, 31(9): 509-512. DOI: 10.3969/j.issn.1001-8891.2009.09.003
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