CHEN Chen, XU Wu-jun, WENG Dong-shan, WEI Jun. The Noise Sources and SNR Analysis of Electronic Multiplying CCD[J]. Infrared Technology , 2007, 29(11): 634-637. DOI: 10.3969/j.issn.1001-8891.2007.11.004
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Citation:
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CHEN Chen, XU Wu-jun, WENG Dong-shan, WEI Jun. The Noise Sources and SNR Analysis of Electronic Multiplying CCD[J]. Infrared Technology , 2007, 29(11): 634-637. DOI: 10.3969/j.issn.1001-8891.2007.11.004
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CHEN Chen, XU Wu-jun, WENG Dong-shan, WEI Jun. The Noise Sources and SNR Analysis of Electronic Multiplying CCD[J]. Infrared Technology , 2007, 29(11): 634-637. DOI: 10.3969/j.issn.1001-8891.2007.11.004
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Citation:
|
CHEN Chen, XU Wu-jun, WENG Dong-shan, WEI Jun. The Noise Sources and SNR Analysis of Electronic Multiplying CCD[J]. Infrared Technology , 2007, 29(11): 634-637. DOI: 10.3969/j.issn.1001-8891.2007.11.004
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