CAO Yi, CHENG Hai-feng, ZHENG Wen-wei, CAI Hong-nian, CHENG Shao-jun. Measure Wideband Emissivity of Coatings with Thermal Imager[J]. Infrared Technology , 2007, 29(6): 316-319. DOI: 10.3969/j.issn.1001-8891.2007.06.002
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Citation:
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CAO Yi, CHENG Hai-feng, ZHENG Wen-wei, CAI Hong-nian, CHENG Shao-jun. Measure Wideband Emissivity of Coatings with Thermal Imager[J]. Infrared Technology , 2007, 29(6): 316-319. DOI: 10.3969/j.issn.1001-8891.2007.06.002
|
CAO Yi, CHENG Hai-feng, ZHENG Wen-wei, CAI Hong-nian, CHENG Shao-jun. Measure Wideband Emissivity of Coatings with Thermal Imager[J]. Infrared Technology , 2007, 29(6): 316-319. DOI: 10.3969/j.issn.1001-8891.2007.06.002
|
Citation:
|
CAO Yi, CHENG Hai-feng, ZHENG Wen-wei, CAI Hong-nian, CHENG Shao-jun. Measure Wideband Emissivity of Coatings with Thermal Imager[J]. Infrared Technology , 2007, 29(6): 316-319. DOI: 10.3969/j.issn.1001-8891.2007.06.002
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