XIN Ji-chuan, XIN Yong. PXI- based Automatic Testing System for Electro-optic Aiming Device[J]. Infrared Technology , 2006, 28(3): 142-146. DOI: 10.3969/j.issn.1001-8891.2006.03.005
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Citation:
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XIN Ji-chuan, XIN Yong. PXI- based Automatic Testing System for Electro-optic Aiming Device[J]. Infrared Technology , 2006, 28(3): 142-146. DOI: 10.3969/j.issn.1001-8891.2006.03.005
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XIN Ji-chuan, XIN Yong. PXI- based Automatic Testing System for Electro-optic Aiming Device[J]. Infrared Technology , 2006, 28(3): 142-146. DOI: 10.3969/j.issn.1001-8891.2006.03.005
|
Citation:
|
XIN Ji-chuan, XIN Yong. PXI- based Automatic Testing System for Electro-optic Aiming Device[J]. Infrared Technology , 2006, 28(3): 142-146. DOI: 10.3969/j.issn.1001-8891.2006.03.005
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